R. P.
Sugavaneshwar
a,
T.
Nagao
b and
K. K.
Nanda
*a
aMaterials Research Centre, Indian Institute of Science, Bangalore, 12 India. E-mail: suga@mrc.iisc.ernet.in; nanda@mrc.iisc.ernet.in; Fax: +91-80-23607316; Tel: +91-80-2293 2996
bInternational Centre for Materials Nanoarchitectonics (MANA), National Institute for Materials Science, 1-1, Namiki, Tsukuba, Ibaraki, Japan. E-mail: taadaki.NAGAO@nims.go.jp
First published on 31st January 2012
We have reported the synthesis of ZnO nanotips on a multi walled carbon nanotube (MWCNT) mat by a vapour transport process. This combination of ZnO nanotips and a MWCNT mat exhibit ideal field emission behaviour. The turn on field and threshold field is found to be 0.34 and 1.5 V μm−1, respectively. The low threshold field is due to the good adherence of the ZnO nanotips on the MWCNT mat. The field enhancement factor is found to be 5 × 102 which is in agreement with the intrinsic field emission factor of ZnO nanotips. The emission current is found to be highly stable even at moderate vacuum.
ZnO has demonstrated the richest nanostructures of all known materials. In recent years tremendous progress has been made in ZnO based FE devices as they are thermally stable and intrinsically oxidation resistant.6–8 In particular, the FE behaviour of ZnO needle/nanopencil like structures have been reported to be the best9–12 because of the increase in the effective electric field at their tips.13 Several groups have successfully synthesized ZnO nanostructures on MWCNTs to obtain an improved field emission performance. Here, we summarize the exceptional results reported until today. A fairly low turn-on field (defined as an E which is required to produce J of 10 μA cm−2) and the low threshold field (defined as E where J is 1 mA cm−2) of 2.5 and 4.0 V μm−1, respectively has been achieved for ZnO nanoneedles on a silicon wafer.9 ZnO nanopencils on a silicon wafer show a low turn-on field of 3.7 V μm−1 and a threshold field of ∼4.6 V μm−1.10 The emission at the low field is attributed to the sharp tip on the nanoneedles/nanopencils. There are reports on the FE studies of ZnO nanostructures coated over carbon nanostructures. ZnO nanoparticles coated over MWCNT show a threshold field of 4.0 V μm−1.14 A threshold field of 3.1 V μm−1 has been reported for ZnO nanowires grown on vertically aligned carbon nanofibers,15 while it is 2.3 V μm−1 for ZnO nanostructures grown on a screen printed MWCNT-film.16 The best results reported up to today are by Ren and co-workers.17 A threshold field of 0.7 V μm−1 has been achieved and the low threshold field is due to the combined effect of the geometry of ZnO and carbon cloth.17 In most of the cases, ZnO nanostructures are grown on the surface of the silicon or nanotubes or nanofibers for the FE studies. However, there are no reports on the FE behavior of ZnO nanoneedles on a MWCNT mat.
Here in this communication we report the synthesis of ZnO nanotips on a MWCNT mat and their FE behavior. The MWCNT mat is synthesized by a one-step pyrolysis technique. MWCNT-ZnO heterostructures are fabricated by growing ZnO nanotips on top of a MWCNT mat by a vapour transport technique. A turn-on field of 0.34 V μm−1 and a threshold field of 1.5 V μm−1 was achieved for 1.0 mA cm−2 which is better than the other MWCNT-ZnO based results. The improved FE is attributed to the sharp tip morphology at the apex of ZnO nanorods and the better adhesion between MWCNT and ZnO. The field enhancement factor is found to be 5 × 102 which is in agreement with the intrinsic field emission factor of ZnO nanotips. The emission current is highly stable even at 10−5 Torr. We have also shown that the morphology of the ZnO nanotips is stable after the field emission studies
After the reaction is over, aligned MWCNT formed on a p-type Si substrate which is kept in the middle of the quartz tube. The MWCNT-ZnO heterostructure was formed by making 10 mg of Zn powder (S.D fine 99.5%) into a compact mass and placing a Si substrate above it in the centre of a quartz boat which is placed inside the alumina tube on a single zone furnace. The MWCNT mats grown on the Si substrate are placed at nearby distances from the source and heated to 650 °C for one hour under an argon gas flow of 110 sccm (standard cubic centimetres per minute). Due to the negligible solid solubility of Zn in Si, the Zn does not dissolve in Si and therefore the Zn vapours which are generated during the experiment are transported under argon flow to nearby regions, forming ZnO nanotips on the MWCNT/Si.
After the experiments, the products are analysed by a Quanta 200 scanning electron microscopy (SEM) and the FE studies are carried out using a custom-built measurement system. FE properties were investigated using a simple diode configuration in a high vacuum chamber at a pressure of 8 × 10−7 Torr. The Si/MWCNT/ZnO nanotip cathode was placed on an aluminium sample stage, and beneath an indium tin oxide/glass anode, separated by an insulating spacer whose thickness is 50 μm. The measured emission area was 36 mm2
Fig. 1 (a) Low and (b) high magnification SEM images of the MWCNT/ZnO nanotips. (c) top and (d) tilted view of ZnO tips. (e) HRTEM image of the tip of the needle. Growth direction as indicated by the arrow is (0002). (f) SAED of the ZnO nanotips. |
J = A(β2V2/ϕd2)exp (−Bϕ3/2d/βV), |
Fig. 2 (a) Schematic of the field emission set up. (b) I–V curve for MWCNT-ZnO and (c) the corresponding FN plot. (d) I–V curve for silicon substrate on Al. |
The effective field enhancement factor β of the ZnO tip can be calculated from the slope of the FN plot if the work function of the emitter is known. Using reported values for the work functions of 5.3 eV for ZnO, the average field enhancement factor of MWCNT-ZnO was found to be ∼5 × 102. The intrinsic field enhancement factor of an individual nanowire is approximately proportional to the aspect ratio of 0.72l/r, where l and r are the length and tip radius of nanowire, respectively.19,20 Since the length of the ZnO nanowires is ∼10 μm and the tip radius is ∼10 nm, the intrinsic field enhancement factor of the ZnO nanotips is calculated to be ∼720. This indicates that the field enhancement factor obtained from the experimental results is consistent with the intrinsic field enhancement factor.
It is well known that the emission current density is strongly dependent on the work function of an emitter surface and the radius of curvature of the emitter apex,21 and emitters grown directly on conducting substrates result in the formation of robust electrical contacts during growth.22 In order to investigate the electrical connectivity between MWCNT and ZnO, we have studied the current (I)–voltage (V) characteristics of the ZnO nanotip grown on a MWCNT mat with the configuration shown in Fig. 3(a) and the IV characteristic is shown in Fig. 3(b). The IV characteristic is linear indicating that the heterostructures are ohmic in nature and the resistance is estimated to be 30 Ω. ZnO and MWCNTs form an ohmic contact23,24 because MWCNTs have a lower work function (4.5–5.0 eV)25,26 than n-type ZnO (5.3–5.4 eV).17
Fig. 3 (a) Schematic of the I–V setup. (b) I–V curve for MWCNT-ZnO structures. High magnification SEM image of the ZnO tips (c) before and (d) after field emission studies. (e) Emission stability of MWCNT-ZnO structures at 3 × 10−5 Torr. |
Emission stability is one of the properties that needs to be evaluated for practical applications. SEM images as shown in Fig. 3(c) & 3(d) taken before and after the field emission studies reveal no change in the morphology that corroborates the high emission stability of MWCNT-ZnO structures. Shown in Fig. 3(e) is the emission current density with respect to different time at an applied voltage of 2.7 V μm−1. It may be noted that the pressure of the system was 3 × 10−5 Torr. As can be seen from this investigation, the emission stability of the ZnO nanotips is excellent. We have also summarised the threshold field Vth for ZnO, WO3 and CdS in Table 1. It is interesting to note that enhanced performance has been reported when the materials are grown on a carbon based substrate, suggesting that growing on a carbon based substrate might lead to improved performance.
Materials | V th (V μm−1) | Reference |
---|---|---|
ZnO | ||
Nanoneedles on Si | 4.0 | 9 |
Nanoneedles on Si | 4.6 | 10 |
Nanoparticles coated over CNTs | 4.0 | 12 |
Nanowires on carbon nanofibers14 | 3.1 | 14 |
Nanomultipode on MWCNT film15 | 2.3 | 15 |
Nanowires on carbon cloth | 0.7 | 16 |
Nanotips on MWCNT | 1.5 | This work |
WO3 | ||
Nanowires on Si | 6.5 (0.014 mA cm−2) | 27 |
Nanobrushes on Si | 8.9(0.14 mA cm−2) | 28 |
Nanowire on ITO glass | 9.1 | 29 |
Whisker Arrays on Si | 6.5 | 30 |
Nanowires on carbon papers | 3.3 | 31 |
CdS | ||
Nanoparticles on SWNT film | 8.5(0.5 mA cm−2) | 32 |
Nanostructures on Si | 20.5 | 33 |
Footnote |
† Electronic Supplementary Information (ESI) available. See DOI: 10.1039/c2ra00001f/ |
This journal is © The Royal Society of Chemistry 2012 |