Issue 41, 2008
From the journal:

Chemical Communications

Defect chemistry of polyfluorenes: identification of the origin of “interface defects” in polyfluorene based light-emitting devices†

Stefan Kappaun,‡*a   Horst Scheiber,‡bc   Roman Trattnig,bc   Egbert Zojer,b   Emil J. W. Listabc  and  Christian Slugovcd  

* Corresponding authors

a NanoTecCenter Weiz Forschungsgesellschaft mbH, Franz-Pichler-Straße 32, Weiz, Austria
E-mail: stefan.kappaun@ntc-weiz.at
Fax: ++43 (0)316 876 8040
Tel: ++43 (0)316 876 8015

b Institute of Solid State Physics, Graz University of Technology, Petersgasse 16, Graz, Austria

c CD-Labor Advanced Functional Materials, Graz University of Technology, Petersgasse 16, Graz, Austria

d Institute for Chemistry and Technology of Materials (ICTM), Graz University of Technology, Stremayrgasse 16, Graz, Austria

Abstract

Deprotonation of hydroxy terminated polyfluorenes results in a greenish emission also providing a rational explanation for so called “interface defects” in polymeric light-emitting devices (PLEDs).

Graphical abstract: Defect chemistry of polyfluorenes: identification of the origin of “interface defects” in polyfluorene based light-emitting devices

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Article information

DOI
https://doi.org/10.1039/B808407F
Article type
Communication
Submitted
19 May 2008
Accepted
12 Aug 2008
First published
12 Sep 2008

Chem. Commun., 2008, 5170-5172

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Defect chemistry of polyfluorenes: identification of the origin of “interface defects” in polyfluorene based light-emitting devices

S. Kappaun, H. Scheiber, R. Trattnig, E. Zojer, E. J. W. List and C. Slugovc, Chem. Commun., 2008, 5170 DOI: 10.1039/B808407F

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