Abstract
A volatile heteroleptic open ruthenocene has been synthesised and characterised by NMR and single crystal X-ray diffraction. Using this compound as a precursor and oxygen as a co-reactant, a highly conductive Ru film has been deposited on Si with native oxide at 220 °C. Under the same deposition conditions, the film thickness obtained with the new compound has almost doubled compared to its homoleptic analogue.