Ri
Chen
a,
Zehan
Xu
a,
Weijun
Xie
a,
Peiquan
Deng
a,
Yunying
Xu
*b,
Lanying
Xu
a,
Guoying
Zhang
a,
Yong
Yang
*a,
Guangming
Xie
ac,
Igor
Zhitomirsky
*d and
Kaiyuan
Shi
e
aSchool of Mechatronic Engineering, Guangdong Polytechnic Normal University, Guangzhou 510450, Guangdong, China. E-mail: yy2008@gpnu.edu.cn
bSchool of Education, Guangdong Polytechnic Normal University, Guangzhou 510450, Guangdong, China. E-mail: yunying.xu@gpnu.edu.cn
cState Key Laboratory for Turbulence and Complex Systems, Intelligent Biomimetic Design Lab, College of Engineering, Peking University, Beijing 100871, China
dDepartment of Materials Science and Engineering, McMaster University, Hamilton L8S 4L7, Ontario, Canada. E-mail: zhitom@mcmaster.ca
eSchool of Materials Science and Engineering, Sun Yat-Sen University, Guangzhou 510275, Guangdong, China
First published on 8th September 2023
Iron oxides with advanced functional properties show great potential for applications in the fields of water splitting, drug delivery, sensors, batteries and supercapacitors. However, it is challenging to develop a simple and efficient strategy for fabricating patterned iron oxide based electrodes for supercapacitor applications. Herein, a facile, simple, scalable, binder-free, surfactant-free and conductive additive-free electric discharge rusting (EDR) technique is proposed to directly synthesize Fe1−xO oxide layer on a pure iron substrate. This new EDR strategy is successfully adopted to fabricate Fe–Fe1−xO integrative patterned electrodes and coplanar microsupercapacitors (CMSC) in one step. The CMSC devices with different geometries could be directly patterned by EDR, which is automatically controlled by a computer numerical control system. The fabricated Fe–Fe1−xO based 3D 2F-CMSC exhibits a maximum areal specific capacitance of 112.4 mF cm−2. Another important finding is the fabrication of 3D 2F-CMSC devices, which show good capacitive behavior at an ultra high scanning rate of 20000 mV s−1. The results prove that EDR is a low-cost and versatile strategy for the scalable fabrication of high-performance patterned supercapacitor integrative electrodes and devices. Furthermore, it is a versatile technique which shows a great potential for development of next generation microelectronic devices, such as microbatteries and microsensors.
Currently, the development of microsupercapacitors is still in its infancy. The need in simple, low-cost manufacturing technologies for the fabrication of high performance microsupercapacitors on a large scale is a bottleneck problem limiting the applications of microsupercapacitors.2,7,8 The early development mode of microsupercapacitors was mainly based on the sandwich structure design. However, the stacked electrode structure is prone to short circuit and electrode misalignment under complex operating conditions. On the other hand, the large distance between the two electrodes results in a long ion transfer distance and increased impedance, which leads to decrease of the power density and energy density of the device. In addition, due to the large size of sandwich-type microsupercapacitors, there is a great challenge in their integration with other miniaturized functional electronic devices.2,9 In contrast, coplanar microsupercapacitors (CMSC) have the advantages of short ion transport distance, reduced risk of short circuit, good compatibility and integration with other miniaturized functional electronic devices.3,10 Despite of increasing interest in CMSC, significant challenges are related to the development of CMSC fabricating processes, which can meet industrial requirements in manufacturing of advanced devices. Currently, the fabrication methods of CMSC mainly include photolithography, plasma etching, stamping, screen printing, inkjet printing, 3D printing, and laser direct writing.2,11–13
Photolithography has been widely used to fabricate microsupercapacitors due to the advantages of the mature fabrication process and high fabrication accuracy.12 Photolithography was combined with electrodeposition for the fabrication of asymmetric supercapacitors.13 It can be seen that although photolithography can produce highly accurate patterned microelectrodes, its complex and time-consuming fabrication process, stringent requirement of fabrication environment, expensive fabrication equipment and high photoresist contamination seriously impede its development prospects for microsupercapacitor fabrication.
Plasma etching is a fast and efficient, but costly technique. This method requires the assistance of other manufacturing processes such as vacuum filtration, sputtering, and spin coating to complete the fabrication of microsupercapacitors. As a result, the manufacturing process is complex and the consumption of template materials is a prerequisite for processing.2,14–16
Stamping is a simple and low-cost microfabrication process, which is based on the use of templates for patterning.17 This process requires the preparation of high-quality inks.18 The manufacturing process of stamped stencils is complicated and time-consuming, the manufacturing accuracy is not high and the bonding between materials is weak, resulting in the unsatisfactory performance of microsupercapacitors.2
The screen printing method has the advantages of low cost, high efficiency and simple process, and it can print microsupercapacitors of different shapes on different substrates. It can directly print patterned microelectrodes with advanced design.19,20 However, the development of screen printing technology is severely limited due to the need in patterned stencils and high-quality printing inks, poor fabrication accuracy of microelectrodes, low active material loading and poor material adhesion to current collectors.2,21–23
Compared with the screen printing strategy, the inkjet printing technique has the advantages of high precision and good process control.24,25 Moreover, the inkjet printing method can also realize the layered printing of patterned current collector and electrode active material. The development and applications of this method are limited by relatively expensive manufacturing equipment, high ink quality requirements and weak bonding between different layers of materials.
3D printing is an advanced manufacturing technology that allows bottom-up layer-by-layer rapid prototyping of 3D structures through computer-aided design, which has the advantages of high digitization and simple structural design. Aiming to enhance capacitive performance of microsupercapacitors, the 3D printing technology is widely used to fabricate 3D microelectrodes with controlled microporosity. This technology facilitates the fabrication of electrodes with relatively high active material loadings and improved ion transport in the porous structures.26–28 Although the 3D printed pseudocapacitive microelectrode structure design can effectively enhance charge storage properties, it fails to achieve scalable fabrication of high-performance microsupercapacitors.
Compared with the other fabrication processes, laser direct writing is a simple, fast, and very promising process for fabricating microsupercapacitors. This method eliminates the need for pre-patterned current collectors and adhesives. Moreover, it enables the simultaneous preparation of patterned current collectors and electrode materials in one step with high fabrication precision.29 However, the currently available laser direct writing method is mainly applicable to the one-step fabrication of patterned carbon-based electrode materials, such as graphene and porous carbon.30,31
Research had been conducted to increase the active mass loading and enhance the conductivity of active materials by designing spiral, honeycomb and array microtubular 3D microstructured electrodes with high specific surface area.32–35 However, the fabrication processes of these 3D microelectrode structures are quite complex. Such processes have disadvantages of multiple time-consuming fabrication steps as well as poor compatibility between different processes and different materials. Therefore, there is an urgent need to develop a new advanced one-step manufacturing process that can synthesize active materials with high specific capacitance and fabricate 3D patterned current collectors with high precision.
The goal of this investigation was the development of EDR technology for manufacturing of CMSC by synthesis of Fe1−xO layer on the iron substrate. EDR is a facile, simple, scalable, binder-free, surfactant-free and conductive additive-free strategy for CMSC manufacturing. This new EDR technique enabled the fabrication of Fe–Fe1−xO based integrative electrodes and CMSC devices in one step. The fabricated Fe–Fe1−xO based electrode showed a maximum areal capacitance of 51.3 mF cm−2 at a scan rate of 10 mV s−1, which is 26 times higher than that of the pure iron electrodes without EDR treatment. Moreover, the CMSC devices with different patterns could be directly fabricated by EDR, which is automatically controlled by computer-aided design. The fabricated Fe–Fe1−xO based 3D CMSC devices achieved a maximum areal capacitance of 112.4 mF cm−2 at 5 mV s−1. The 3D CMSC devices showed good capacitive behavior and achieved a high areal capacitance of 4.5 mF cm−2 at ultrahigh applied scan rate of 20000 mV s−1. The results prove that EDR it is a versatile technique which shows a great potential for developing next generation microelectronic devices.
Fig. 2 SEM images at different magnification of Fe metal substrate (a and b) before EDR and (c–f) after EDR. |
The Fe–Fe1−xO integrative electrode fabricated by EDR was subjected to XRD study and obtained results were presented in Fig. 3a. The peaks centered at 44.2° and 64.3° are attributed to planes (110) and (200) of pure Fe metal substrate (PDF #85-1410), respectively.37 The peaks centered at 36.2°, 42.1°, 61.0°, 72.9°and 76.8° correspond to the planes (111), (200), (220), (311) and (222) of wüstite (PDF #84-0302), respectively.38 Therefore, the results verified the formation of Fe–Fe1−xO integrative electrodes, where Fe substrates play the role of the current collector and Fe1−xO particles act as the active materials. The electrodes were successfully fabricated by a one-step EDR strategy which is automatically controlled by the digital control system. EDS investigations were performed to examine the element distribution characteristics of the Fe–Fe1−xO integrative electrodes. The SEM image of the electrode area for EDS elemental mapping is shown in Fig. 2e. From the EDS data presented in Fig. 3b and c, it is seen that the Fe1−xO particles generated on the Fe substrate surface by the EDR showed uniform iron and oxygen element distribution.
The electrochemical properties of Fe based electrodes before or after rusted by the EDR technique were investigated in three electrodes system using cyclic voltammetry (CV) in 1 M KOH solution in a potential range of −0.8 V to 0 V versus Hg/HgO. From Fig. 4a, it is obvious that the Fe based electrode before EDR processing showed very small current response, whereas the Fe based electrode after EDR treatment gained a much higher current density at the same scanning rate of 100 mV s−1. These phenomena were also observed at various scanning rates of 10, 20, 50 and 200 mV s−1 (Fig. 4b and c). The areal capacitances of the Fe based electrodes before or after EDR processing were estimated from the CV curves. As shown in Fig. 4d, the areal capacitances of the Fe based electrodes after EDR processing were much higher than those without EDR processing at all testing conditions. For instance, Fe based electrode after EDR processing showed a high areal capacitance of 51.3 mF cm−2 at 10 mV s−1, which was 26 times larger than that without EDR processing at the same testing scanning rate. The improved capacitance is attributed to the high capacitance of Fe1−xO microsphere particles, which formed a porous microstructure. The microstructure of active materials provides sufficient surface area for efficient redox reactions. Moreover, the Fe–Fe1−xO integrative electrode design without adding any low conductivity binder and conductive media facilitated rapid electron transportation during charge–discharge processes.
The Fe–Fe1−xO integrative electrodes were machined into square maze 3D CMSC devices with different orbits (such as T-CMSC and F-CMSC, shown in Fig. 1b and c). These Fe– Fe1−xO based square maze 3D CMSC devices were examined at a testing voltage range from 0 to 0.8 V in 1 M KOH electrolyte and the applied scanning rates ranging from 5 to 20000 mV s−1. Fig. 5 presented the CV testing results of T-CMSC and F-CMSC obtained at relatively low applied scanning rates ranged from 5 to 200 mV s−1. From Fig. 5a, it is found that the current response of F-CMSC was much higher than that of T-CMSC at the same testing condition of 100 mV s−1. The same phenomena were observed for T-CMSC and F-CMSC at other applied scanning rates, which were displayed in Fig. 5b and c, respectively. Fig. 5d exhibits the areal capacitances of T-CMSC and F-CMSC obtained from corresponding CV curves in Fig. 5b and c. It is seen that the F-CMSC device showed remarkably higher areal capacitances than the T-CMSC device at all applied scanning rates. The highest areal capacitance values gained at 5 mV s−1 for T-CMSC and F-CMSC were 27.1 and 45 mF cm−2, respectively. At a higher scanning rate of 200 mV s−1, the areal capacitance value obtained for F-CMSC was 17.5 mF cm−2, whereas T-CMSC showed only 4.6 mF cm−2. This implied that F-CMSC with small electrode width was more beneficial for storing energy compared to T-CMSC, especially at relatively high applied scanning rates. In order to further prove the advantages of the Fe–Fe1−xO based integrative devices, prepared by EDR, the T-CMSC and F-CMSC microdevices were examined at superhigh scanning rates from 1000 to 20000 mV s−1. Fig. 6 presents the CV testing results of T-CMSC and F-CMSC obtained at these superhigh scanning rates. From Fig. 6a, it is easy to find that the current response of F-CMSC was also much higher than that of T-CMSC at 1000 mV s−1, which correlates with testing results at 100 mV s−1. The same phenomena were also observed for T-CMSC and F-CMSC at other ultra-high applied scanning rates, as it is shown in Fig. 6b and c, respectively. It is important to note that CV curves for T-CMSC and F-CMSC maintained a good box shape at these ultra-high applied scanning rates (1000–20000 mV s−1), which indicated that the fabricated Fe–Fe1−xO based integrative devices by EDR achieved good capacitive behavior. Fig. 6d described the areal capacitances of T-CMSC and F-CMSC obtained from corresponding CV curves in Fig. 6b and c. The F-CMSC device achieved a remarkably higher areal capacitance than the T-CMSC device at all applied scanning rates. When the scanning rate increased to 20000 mV s−1, the areal capacitance value obtained for F-CMSC was still as high as 3.5 mF cm−2. This is because F-CMSC with small electrode width and porous microstructure facilitated efficient ion transport and the binder-free Fe–Fe1−xO integrative electrode design facilitated the electron transport. In order to further study the capacitive behavior of F-CMSC devices with five orbits, GCD characterization was carried out with different applied current densities (0.2 to 5 mA cm−2) at a voltage window of 0–0.8 V. The GCD curves showed a symmetric triangle configuration at all examined current densities (Fig. 7a and b), which indicated that good capacitive performance was achieved for F-CMSC devices. The corresponding capacitance values calculated from the GCD curves were presented in Fig. 7c and d. A maximum areal capacitance of 33.6 mF cm−2 was obtained at a current density of 0.2 mA cm−2. The areal capacitance value decreased with the increase of current density. It is important to find that F-CMSC devices still maintained a high areal capacitance of 6.3 mF cm−2 at a high current density of 5 mA cm−2. This is attributed to the high theoretical capacitance of iron oxide particles, advanced microstructures generated by EDR, binder-free electrode design and small electrode width, which were greatly helpful for ion and electron migration and obtaining enhanced capacitive performance.
More importantly, aiming to examine the advantage of the EDR manufacturing technique for fabricating there-dimensional CMSC devices, thicker Fe pure metal substrates with a thickness of 2 mm were adopted as the original materials for fabricating 3D CMSC devices with five orbits (named as 2F-CMSC). Fig. 8a and b present the CV curves for 3D 2F-CMSC devices at low scan rates of 5–200 mV s−1 and high scan rates of 1000–20000 mV s−1, respectively. The results showed that all the CV curves maintained a rectangle configuration at all scanning rates, which indicated that good capacitive behavior was obtained for 3D 2F-CMSC devices. The corresponding capacitance value calculated from the CV curves were presented in Fig. 8c and d. The 3D 2F-CMSC devices achieved a maximum areal capacitance of 112.4 mF cm−2 (5 mV s−1), which is 2.5 times higher than that obtained for F-CMSC, which is just 45 mF cm−2 (5 mV s−1) (Fig. 5d). It is suggested that the thicker 3D electrode configuration enabled for loading more active materials and providing more active sites for charge accumulation. Moreover, these obtained values of areal capacitance for 3D 2F-CMSC in this work were larger than many other reported values in literature for coplanar microsupercapacitors, such as V-doped BiFeO3//PPy asymmetric CMSC (10 mF cm−2 at 20 mV s−1) fabricated by the combination of electrochemical deposition, electrophoretic deposition and chemical polymerization methods,39 CuHCF-CNT//Fe2O3-CNT asymmetric CMSC (15 mF cm−2 at 200 mV s−1) fabricated by the combination of laser engraving and capillary force assisted printing methods,40 RuO2//Ti3C2Tx asymmetric CMSC (60 mF cm−2 at 5 mV s−1) fabricated by the combination of laser cutting and hydrothermal methods,41 and MnO2//VN asymmetric CMSC (16.1 mF cm−2 at 1 mV s−1) fabricated by the combination of chemical precipitation and mask-assisted filtration.42 Therefore, it is important to mention that the EDR technique proposed in this work not only greatly simplified the manufacturing process for high performance 3D CMSC devices, but also successfully eliminated complicated pretreatment and posttreatment processing, and avoided the usage of low conductive binder, conductive media, hazardous solvent, additional current collector and expensive manufacturing equipment. Additionally, Fig. 8c and d showed that the areal capacitance value decreased with the increasing scanning rate. The rate capacity of 3D 2F-CMSC was 33% when the scanning rate increased from 5 to 100 mV s−1. More importantly, the 3D 2F-CMSC devices still maintained a high areal capacitance of 4.5 mF cm−2 at a superhigh scanning rate of 20000 mV s−1, and the capacitance ratio of 4% was still achieved even when the applied scanning rate has been increased up to 4000-folds of the initial value. It is important to note that the metal oxide based coplanar microsupercapacitors fabricated by other techniques in the literature normally could be operated only at relatively low scanning rates below 200 mV s−1 (ref. 43–45). Even at such low applied scanning rates, their CV curves showed deviation from a rectangle shape, which indicated poor capacitive performance at high applied scanning rates. In contrast, it is easy to find that the 3D 2F-CMSC device fabricated by one-step EDR strategy show good capacitive properties at a superhigh scanning rate of 20000 mV s−1 (Fig. 8b), which was 100 times higher than those used in the literature.39,43–45 Moreover, the 2F-CMSC device showed 81.67% capacitance retention after 2000 cycles at a scan rate of 500 mV s−1 (Fig. 1S†). More importantly, the good capacitive performance at superhigh applied scanning rates was achieved without any conducting additives. Subsequently, GCD characterization was conducted to study the capacitive performance of 3D 2F-CMSC devices with applied current densities of 0.2–5 mA cm−2 at a voltage window of 0–0.8 V. The GCD curves showed a symmetric triangle shape at all examined current densities (Fig. 9a and b), which indicated that good capacitive performance was achieved for 2F-CMSC devices. The corresponding capacitance value calculated from the GCD curves were presented in Fig. 9c and d. A maximum areal capacitance of 51.2 mF cm−2 was obtained at 0.2 mA cm−2, which was larger than reported areal capacitance values of CMSC devices, such as CuSe@FeOOH//CuSe@MnOOH CMSC (20.5 mF cm−2 at 0.11 mA cm−2) fabricated by combining photolithography and electrodeposition methods,45 Co(OH)2//VN hybrid CMSC (21 mF cm−2 at 0.2 mA cm−2) fabricated by combining chemical precipitation, electrochemical exfoliation and vacuum filtration methods,44 and MnO2-graphite//graphite CMSC (220 µF cm−2 at 2.5 µA cm−2) fabricated by combining simple pencil drawing and electrodeposition methods.43 The areal capacitance value decreased as the current density increased. It is important to mention that 3D 2F-CMSC devices still maintained a high areal capacitance of 12.5 mF cm−2 at a high current density of 5 mA cm−2. This is attributed to the high theoretical capacitance of iron oxide particles, advanced microstructures generated by EDR, binder-free electrode configuration design, 3D current collector configuration design and small electrode width, which were greatly helpful for ion/electron migration and making full use of Fe1−xO active materials, and thus enhanced capacitive performance of 3D 2F-CMSC devices was achieved. In addition, the one-step EDR strategy proposed in this work was able to fabricate 3D CMSC devices with various designable patterns drawed by the CAD software, and the whole manufacturing procedures could be automatically controlled by computer numerical control system, which could improve the fabrication efficiency and reduce the manpower as well as resources. Moreover, as the fabricating process of EDR eliminated the utilization of toxic solvents, it offers health and environmental benefits. The developed one-step EDR technique in this research paves the way for synthesis of different metal oxide based materials for various applications, such as lithium-ion batteries, catalysts, sensors, water splitting and drug delivery.
Footnote |
† Electronic supplementary information (ESI) available. See DOI: https://doi.org/10.1039/d3ra04838a |
This journal is © The Royal Society of Chemistry 2023 |